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PII: S0720-048X(04)00165-2
doi:10.1016/j.ejrad.2004.05.006
© 2004 Published by Elsevier Inc.
PII: S0720-048X(04)00165-2
doi:10.1016/j.ejrad.2004.05.006
© 2004 Published by Elsevier Inc.